中国高校科技期刊研究会第9次会员代表大会在北京召开，中宣部出版局副局长张怀海、教育部科学技术与信息化司一级巡视员张国辉等领导出席会议并发表..
英文简介：Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged.Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.中文简介：（来自Google、百度翻译）微电子可靠性，致力于传播微电子器件、电路和系统可靠性的最新研究成果和相关信息，从材料、工艺和制造，到设计、测试和操作。该期刊的覆盖范围包括以下主题: 测量，理解和分析; 评估和预测; 建模和模拟; 方法和缓解。将可靠性与微电子工程的其他重要领域 (例如设计，制造，集成，测试和现场操作) 相结合的论文也将受到欢迎，特别鼓励报告该领域和特定应用领域案例研究的实用论文。 大多数被接受的论文将作为研究论文发表，描述重大进展和已完成的工作。评论具有普遍兴趣的重要发展主题的论文可以作为评论论文被接受发表。可以考虑将具有更初步性质的紧急通讯和有关当前感兴趣的已完成实际工作的简短报告作为研究说明出版。所有贡献都要接受该领域领先专家的同行审查。
